I thought this would probably be better in a separate thread although I'm prepared for it to be merged.
Please could you clarify, referencing the individual experiments by the number in the list, why you think that the particular test (or group of tests) is pointless or not pointless for ascertaining what the red/gray material is in the WTC dust. The following is from markbasile.org but my numbering.
1. - Red/gray chip separation using optical microscopy and magnetic attraction to assist in isolation of particles of interest.
2. - Optical images of collected particulates as collected at appropriate magnifications to record condition as collected.
3. - SEM/EDX with elemental quantification of red/gray chips, both red and gray layers.
4. FTIR analysis of organic components of red/gray chips, both red and gray layers.
5. ESCA small spot technique with argon ion sputter for depth profiling to definitively establish the presence of elemental aluminum within the red layer of the red/gray chips. Scans of gray layer also to be taken to add to information base.
6. DSC analysis of red/gray chips focusing on exothermic/endothermic reactions near 400 degrees C. Some chips to be scanned in inert atmosphere and some in air or oxygen containing gas stream.
7. SEM/EDX with elemental quantification of residual products of DSC analysis of red/gray chips.
8. Optical images of reaction products after DSC experiments.
Please could you clarify, referencing the individual experiments by the number in the list, why you think that the particular test (or group of tests) is pointless or not pointless for ascertaining what the red/gray material is in the WTC dust. The following is from markbasile.org but my numbering.
1. - Red/gray chip separation using optical microscopy and magnetic attraction to assist in isolation of particles of interest.
2. - Optical images of collected particulates as collected at appropriate magnifications to record condition as collected.
3. - SEM/EDX with elemental quantification of red/gray chips, both red and gray layers.
4. FTIR analysis of organic components of red/gray chips, both red and gray layers.
5. ESCA small spot technique with argon ion sputter for depth profiling to definitively establish the presence of elemental aluminum within the red layer of the red/gray chips. Scans of gray layer also to be taken to add to information base.
6. DSC analysis of red/gray chips focusing on exothermic/endothermic reactions near 400 degrees C. Some chips to be scanned in inert atmosphere and some in air or oxygen containing gas stream.
7. SEM/EDX with elemental quantification of residual products of DSC analysis of red/gray chips.
8. Optical images of reaction products after DSC experiments.
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